Based on the results of complex methods of physicochemical analysis: differential thermal analysis (DTA), X-ray diffraction (XRD), microstructural analysis (MSA), as well as microhardness and density, the chemical interaction in the GaSe-SrSe system was studied and its Tx phase diagram was constructed. It has been established that the phase diagram of the system is of a quasi-binary eutectic type and is characterized by the formation of the SrGaSe₂ compound. The SrGaSe₂ compound is formed at a temperature of 1010°C as a result of the peritectic reaction M+SrSe↔ SrGaSe₂. Co-crystallization of SrSe and SrGaSe₂ compounds crystallizes at the double eutectic point, composition 15 mol % SrSe, temperature 920°C. In the GaSe-SrSe system at room temperature, 4.5 mol % SrSe based on GaSe, while the solubility based on SrSe compound is 2.5 mol % GaSe. X-ray diffraction analysis of samples containing 4.5; 25, 50 and 80 mol. % SrSe and compared with the diffraction maxima of the main components. As a result, it was found that the diffraction lines in the diffraction pattern of the 4.5 mol % SrSe are similar to the diffraction lines of the GaSe compound; they differ slightly only in the interplanar distances. Based on the results of X-ray diffraction analysis, it was established that the SrGaSe₂ compound crystallizes in a tetragonal syngony with lattice parameters: a = 6.85; c=10.01 Å. The dependence of electrical conductivity and thermionic conductivity of solid solutions of (GaSe)_1-х(SrSe)_х (x=0.02; 0.04) alloys on composition and temperature was studied.

doi.org/10.32737/0005-2531-2026-2-50-57